Thin Film Inspection Ordering
SPECIALTY RF / MICROWAVE / MILLIMETER-WAVE
COMPONENT SOLUTIONS
Home > Products > Thin-Film Technologies > Inspection Methods, General Ordering Information
Inspection Methods, General Ordering Information
| Inspection Methods | ||||||||||
|---|---|---|---|---|---|---|---|---|---|---|
| Visual | 100% Per MIL-STD-883, method 2032 Class H or K (10X microscope min.); IPC-A-610 | |||||||||
| Dimensional | AQL Pattern features: Microscope; Substrate: Micrometer and calipers | |||||||||
| Resistors | AQL 2 or 4 Point Probe | |||||||||
| Adhesion | AQL Tape pull test with 3M #610 tape | |||||||||
| Other | Customer Specified | |||||||||
| General Ordering Information | ||||||||||
|---|---|---|---|---|---|---|---|---|---|---|
| Substrates | Type, surface finish, dimensions and tolerances. | |||||||||
| Resistsive Films | Type, nominal resistivity, tolerance after heat treatment. Heat treatment temperature and time. | |||||||||
| Conductive Films | Type, thickness and tolerance. | |||||||||
| General | Specifications and acceptance criteria. | |||||||||
| Artwork | Dimensioned Drawings, DXF, DWG, Gerber or GDS Formats. | |||||||||
| Processing | Temperatures, bonding/soldering methods and environment. | |||||||||
